Ion irradiation-induced localized stress relaxation in W thin film revealed by cross-sectional X-ray nanodiffraction

Hlushko, K., Mackova, A., Zalesak, J., Burghammer, M., Davydok, A., Krywka, C., Daniel, R., Keckes, J. & Todt, J., 7 Feb 2021, In: Thin solid films. 722.2021, 31 March, 6 p., 138571.

Research output: Contribution to journal › Article › Research › peer-review

Improved electro-mechanical reliability of flexible systems with alloyed Mo-Ta adhesion layers

Kreiml, P., Rausch, M., Terziyska, V., Köstenbauer, H., Winkler, J., Mitterer, C. & Cordill, M. J., 9 Jan 2021, (E-pub ahead of print) In: Thin solid films. 720.2021, 28 February, 9 p., 138533.

Research output: Contribution to journal › Article › Research › peer-review

Mechanical properties of homogeneous and nitrogen graded TiN thin films

Silva, F. C., Tunes, M. A., Sagás, J. C., Fontana, L. C., de Lima, N. B. & Schön, C. G., 30 Sept 2020, In: Thin solid films. 710, p. 138268 1 p., 138268.

Research output: Contribution to journal › Article › Research › peer-review

Microstructure and stress gradients in TiW thin films characterized by 40 nm X-ray diffraction and transmission electron microscopy

Saghaeian, F., Keckes, J., Woehlert, S., Rosenthal, M., Reisinger, M. & Todt, J., 1 Dec 2019, In: Thin solid films. 691, 137576.

Research output: Contribution to journal › Article › Research › peer-review

The effect of B and C addition on microstructure and mechanical properties of TiN hard coatings grown by chemical vapor deposition

Kainz, C., Schalk, N., Tkadletz, M., Mitterer, C. & Czettl, C., 31 Oct 2019, In: Thin solid films. 688.2019, 137283, 8 p., 137283.

Research output: Contribution to journal › Article › Research › peer-review

Thermal expansion of magnetron sputtered TiC_xN_1-x coatings studied by high-temperature X-ray diffraction

Saringer, C., Kickinger, C., Munnik, F., Mitterer, C., Schalk, N. & Tkadletz, M., 31 Oct 2019, In: Thin solid films. 688, 137307.

Research output: Contribution to journal › Article › Research › peer-review

Correlation of mechanical damage and electrical behavior of Al/Mo bilayers subjected to bending

Kreiml, P., Rausch, M., Terziyska, V. L., Köstenbauer, H., Winkler, J., Mitterer, C. & Cordill, M. J., 1 Oct 2019, In: Thin solid films. 687, 137480.

Research output: Contribution to journal › Article › Research › peer-review

Crack arrest in thin metallic film stacks due to material- and residual stress inhomogeneities

Kozic, D., Gänser, H-P., Brunner, R., Kiener, D., Antretter, T. & Kolednik, O., 31 Dec 2018, In: Thin solid films. p. 14-22 9 p.

Research output: Contribution to journal › Article › Research › peer-review

Recent developments in surface science and engineering, thin films, nanoscience, biomaterials, plasma science, and vacuum technology

Mozetic, M., Vesel, A., Primc, G., Eisenmenger-Sittner, C., Bauer, J., Eder, A., Schmid, G. H. S., Ruzic, D. N., Ahmed, Z., Barker, D., Douglass, K. O., Eckel, S., Fedchak, J. A., Hendricks, J., Klimov, N., Ricker, J., Scherschligt, J., Stone, J., Strouse, G., Capan, I., & 31 othersBuljan, M., Milosevic, S., Teichert, C., Cohen, S. R., Silva, A. G., Lehocky, M., Humpolicek, P., Rodriguez, C., Hernandez-Montelongo, J., Mercier, D., Manso-Silvan, M., Ceccone, G., Galtayries, A., Stana-Kleinschek, K., Petrov, I., Greene, J. E., Avila, J., Chen, C. Y., Caja-Munoz, B., Yi, H., Boury, A., Lorcy, S., Asensio, M. C., Bredin, J., Gans, T., O'Connell, D., Brendin, J., Reniers, F., Vincze, A., Anderle, M. & Montelius, L., 30 Aug 2018, In: Thin solid films. 660, p. 120-160

Research output: Contribution to journal › Review article › peer-review