Correlation of mechanical damage and electrical behavior of Al/Mo bilayers subjected to bending
Research output: Contribution to journal › Article › Research › peer-review
Authors
Organisational units
External Organisational units
- Business Unit Electronics
- PLANSEE SE
- Erich Schmid Institute of Materials Science
Details
Original language | English |
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Article number | 137480 |
Journal | Thin solid films |
Volume | 687 |
DOIs | |
Publication status | Published - 1 Oct 2019 |