Correlation of mechanical damage and electrical behavior of Al/Mo bilayers subjected to bending

Research output: Contribution to journalArticleResearchpeer-review

External Organisational units

  • Business Unit Electronics
  • PLANSEE SE
  • Erich Schmid Institute of Materials Science

Details

Original languageEnglish
Article number137480
JournalThin solid films
Volume687
DOIs
Publication statusPublished - 1 Oct 2019