Ion irradiation-induced localized stress relaxation in W thin film revealed by cross-sectional X-ray nanodiffraction

Hlushko, K., Mackova, A., Zalesak, J., Burghammer, M., Davydok, A., Krywka, C., Daniel, R., Keckes, J. & Todt, J., 7 Feb. 2021, in: Thin solid films. 722.2021, 31 March, 6 S., 138571.

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Improved electro-mechanical reliability of flexible systems with alloyed Mo-Ta adhesion layers

Kreiml, P., Rausch, M., Terziyska, V., Köstenbauer, H., Winkler, J., Mitterer, C. & Cordill, M. J., 9 Jan. 2021, (Elektronische Veröffentlichung vor Drucklegung.) in: Thin solid films. 720.2021, 28 February, 9 S., 138533.

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Mechanical properties of homogeneous and nitrogen graded TiN thin films

Silva, F. C., Tunes, M. A., Sagás, J. C., Fontana, L. C., de Lima, N. B. & Schön, C. G., 30 Sept. 2020, in: Thin solid films. 710, S. 138268 1 S., 138268.

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Microstructure and stress gradients in TiW thin films characterized by 40 nm X-ray diffraction and transmission electron microscopy

Saghaeian, F., Keckes, J., Woehlert, S., Rosenthal, M., Reisinger, M. & Todt, J., 1 Dez. 2019, in: Thin solid films. 691, 137576.

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The effect of B and C addition on microstructure and mechanical properties of TiN hard coatings grown by chemical vapor deposition

Kainz, C., Schalk, N., Tkadletz, M., Mitterer, C. & Czettl, C., 31 Okt. 2019, in: Thin solid films. 688.2019, 137283, 8 S., 137283.

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Thermal expansion of magnetron sputtered TiC_xN_1-x coatings studied by high-temperature X-ray diffraction

Saringer, C., Kickinger, C., Munnik, F., Mitterer, C., Schalk, N. & Tkadletz, M., 31 Okt. 2019, in: Thin solid films. 688, 137307.

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Correlation of mechanical damage and electrical behavior of Al/Mo bilayers subjected to bending

Kreiml, P., Rausch, M., Terziyska, V. L., Köstenbauer, H., Winkler, J., Mitterer, C. & Cordill, M. J., 1 Okt. 2019, in: Thin solid films. 687, 137480.

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Crack arrest in thin metallic film stacks due to material- and residual stress inhomogeneities

Kozic, D., Gänser, H-P., Brunner, R., Kiener, D., Antretter, T. & Kolednik, O., 31 Dez. 2018, in: Thin solid films. S. 14-22 9 S.

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Recent developments in surface science and engineering, thin films, nanoscience, biomaterials, plasma science, and vacuum technology

Mozetic, M., Vesel, A., Primc, G., Eisenmenger-Sittner, C., Bauer, J., Eder, A., Schmid, G. H. S., Ruzic, D. N., Ahmed, Z., Barker, D., Douglass, K. O., Eckel, S., Fedchak, J. A., Hendricks, J., Klimov, N., Ricker, J., Scherschligt, J., Stone, J., Strouse, G., Capan, I., &31 mehrBuljan, M., Milosevic, S., Teichert, C., Cohen, S. R., Silva, A. G., Lehocky, M., Humpolicek, P., Rodriguez, C., Hernandez-Montelongo, J., Mercier, D., Manso-Silvan, M., Ceccone, G., Galtayries, A., Stana-Kleinschek, K., Petrov, I., Greene, J. E., Avila, J., Chen, C. Y., Caja-Munoz, B., Yi, H., Boury, A., Lorcy, S., Asensio, M. C., Bredin, J., Gans, T., O'Connell, D., Brendin, J., Reniers, F., Vincze, A., Anderle, M. & Montelius, L., 30 Aug. 2018, in: Thin solid films. 660, S. 120-160

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