Stress factors and absolute residual stresses in thin films determined by the combination of curvature and sin2 methods

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Translated title of the contributionStress factors and absolute residual stresses in thin films determined by the combination of curvature and sin2 methods
Original languageEnglish
Publication statusPublished - 2006
Event7th European Conference Residual Stresses ECRS7 - Berlin, Germany
Duration: 13 Sept 200615 Sept 2006

Conference

Conference7th European Conference Residual Stresses ECRS7
Country/TerritoryGermany
CityBerlin
Period13/09/0615/09/06