Stress factors and absolute residual stresses in thin films determined by the combination of curvature and sin2 methods

Research output: Contribution to conference › Poster › Research › peer-review

Stress factors and absolute residual stresses in thin films determined by the combination of curvature and sin2 methods. / Martinschitz, Klaus-Jürgen; Eiper, E.; Keckes, Jozef.
2006. Poster session presented at 7th European Conference Residual Stresses ECRS7, Berlin, Germany.

Research output: Contribution to conference › Poster › Research › peer-review

Martinschitz, K.-J., Eiper, E., & Keckes, J. (2006). Stress factors and absolute residual stresses in thin films determined by the combination of curvature and sin2 methods. Poster session presented at 7th European Conference Residual Stresses ECRS7, Berlin, Germany.

Martinschitz, Klaus-Jürgen ; Eiper, E. ; Keckes, Jozef. / Stress factors and absolute residual stresses in thin films determined by the combination of curvature and sin2 methods. Poster session presented at 7th European Conference Residual Stresses ECRS7, Berlin, Germany.

@conference{cb2e5e0ceeda44bca7b3d8e2ba9c72ca,

title = "Stress factors and absolute residual stresses in thin films determined by the combination of curvature and sin2 methods",

author = "Klaus-J{\"u}rgen Martinschitz and E. Eiper and Jozef Keckes",

year = "2006",

language = "English",

note = "7th European Conference Residual Stresses ECRS7 ; Conference date: 13-09-2006 Through 15-09-2006",

}

TY - CONF

T1 - Stress factors and absolute residual stresses in thin films determined by the combination of curvature and sin2 methods

AU - Martinschitz, Klaus-Jürgen

AU - Eiper, E.

AU - Keckes, Jozef

PY - 2006

Y1 - 2006

M3 - Poster

T2 - 7th European Conference Residual Stresses ECRS7

Y2 - 13 September 2006 through 15 September 2006

ER -

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