Christian Mitterer
Publications / Theses
- 2015
- Published
Restrictions of stress measurements using the curvature method by thermally induced plastic deformation of silicon substrates
Saringer, C., Tkadletz, M. & Mitterer, C., 25 Jul 2015, In: Surface & coatings technology. 274, p. 68-75 8 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Effect of wavelength modulation of arc evaporated Ti-Al-N/Ti-Al-V-N multilayer coatings on microstructure and mechanical/tribological properties
Pfeiler-Deutschmann, M., Mayrhofer, P. H., Chladil, K., Penoy, M., Michotte, C., Kathrein, M. & Mitterer, C., 1 Jan 2015, In: Thin solid films. 581, p. 20-24 5 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Advances in coating characterization: Towards a comprehensive understanding of microstructure-property-performance relations of hard coatings: From improved composition/microstructure/property relations to insights in degradation behavior
Mitterer, C., 2015.Research output: Contribution to conference › Presentation › Research
- Published
Antibacterial silicon oxide thin films doped with zinc and copper grown by atmospheric pressure plasma chemical vapor deposition: Microstructure and antibacterial / cytotoxic properties of Zn- and Cu-SiOx films
Mitterer, C., Jäger, E., Schmidt, J., Pfuch, A., Spange, S., Beier, O., Jantschner, O. & Daniel, R., 2015.Research output: Contribution to conference › Presentation › Research › peer-review
- Published
Copper diffusion into single-crystalline TiN studied by transmission electron microscopy and atom probe tomography
Mühlbacher, M., Mendez Martin, F., Sartory, B., Schalk, N., Keckes, J., Lu, J., Hultman, L. & Mitterer, C., 2015, In: Thin solid films. 574, p. 103-109Research output: Contribution to journal › Article › Research › peer-review
- Published
Cu diffusion in single-crystal and polycrystalline TiN barrier layers: A high-resolution experimental study supported by first-principles calculations
Mühlbacher, M., Bochkarev, A. S., Mendez Martin, F., Sartory, B., Chitu, L., Popov, M., Puschnig, P., Spitaler, J., Ding, H., Schalk, N., Lu, J., Hultman, L. & Mitterer, C., 2015, In: Journal of applied physics. 118, p. 085307-1 - 085307-11Research output: Contribution to journal › Article › Research › peer-review
- Published
Deformation behavior of nanostructured molybdenum thin films on flexible substrates
Jörg, T., Cordill, M., Glushko, O., Franz, R., Winkler, J. & Mitterer, C., 2015.Research output: Contribution to conference › Presentation › Research
- Published
Diffusion in the Cu/TiN thin film system studied by atom probe tomography correlated with transmission electron microscopy and first-principles calculations
Mühlbacher, M., Mendez Martin, F., Lu, J., Schalk, N., Hultman, L. & Mitterer, C., 2015.Research output: Contribution to conference › Presentation › Research › peer-review
- Published
Dry-blasting of CVD α-Al2O3 hard coatings: Influence of blasting media size, hardness and coating texture on the stress-depth gradients investigated by X-ray nanodiffraction
Tkadletz, M., Schalk, N., Keckes, J., Krajinovic, I., Czettl, C. & Mitterer, C., 2015.Research output: Contribution to conference › Presentation › Research › peer-review
- Published
Effect of growth conditions on stress, texture, roughness and self-annealing behavior of sputter deposited Cu films
Souli, I. & Mitterer, C., 2015.Research output: Contribution to conference › Poster › Research › peer-review
