Surface analysis of epitaxially grown GeSn alloys with Sn contents between 15% and 18%

Research output: Contribution to journalArticleResearchpeer-review

Standard

Surface analysis of epitaxially grown GeSn alloys with Sn contents between 15% and 18%. / Kormos, Lukas; Kratzer, Markus; Kostecki, Konrad et al.
In: Surface and interface analysis, 01.04.2017.

Research output: Contribution to journalArticleResearchpeer-review

Bibtex - Download

@article{a0ad409ad3574474b55858e98544f504,
title = "Surface analysis of epitaxially grown GeSn alloys with Sn contents between 15% and 18%",
keywords = "GeSn alloy, phase separation, epitaxy",
author = "Lukas Kormos and Markus Kratzer and Konrad Kostecki and Michael Oehme and Tomas Sikola and Erich Kasper and J{\"o}rg Schulze and Christian Teichert",
year = "2017",
month = apr,
day = "1",
language = "English",
journal = "Surface and interface analysis",
issn = "0142-2421",
publisher = "John Wiley & Sons Ltd",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Surface analysis of epitaxially grown GeSn alloys with Sn contents between 15% and 18%

AU - Kormos, Lukas

AU - Kratzer, Markus

AU - Kostecki, Konrad

AU - Oehme, Michael

AU - Sikola, Tomas

AU - Kasper, Erich

AU - Schulze, Jörg

AU - Teichert, Christian

PY - 2017/4/1

Y1 - 2017/4/1

KW - GeSn alloy

KW - phase separation

KW - epitaxy

M3 - Article

JO - Surface and interface analysis

JF - Surface and interface analysis

SN - 0142-2421

ER -