Surface analysis of epitaxially grown GeSn alloys with Sn contents between 15% and 18%
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
Surface analysis of epitaxially grown GeSn alloys with Sn contents between 15% and 18%. / Kormos, Lukas; Kratzer, Markus; Kostecki, Konrad et al.
in: Surface and interface analysis, 01.04.2017.
in: Surface and interface analysis, 01.04.2017.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Kormos, L, Kratzer, M, Kostecki, K, Oehme, M, Sikola, T, Kasper, E, Schulze, J & Teichert, C 2017, 'Surface analysis of epitaxially grown GeSn alloys with Sn contents between 15% and 18%', Surface and interface analysis.
APA
Kormos, L., Kratzer, M., Kostecki, K., Oehme, M., Sikola, T., Kasper, E., Schulze, J., & Teichert, C. (2017). Surface analysis of epitaxially grown GeSn alloys with Sn contents between 15% and 18%. Surface and interface analysis.
Vancouver
Kormos L, Kratzer M, Kostecki K, Oehme M, Sikola T, Kasper E et al. Surface analysis of epitaxially grown GeSn alloys with Sn contents between 15% and 18%. Surface and interface analysis. 2017 Apr 1.
Author
Bibtex - Download
@article{a0ad409ad3574474b55858e98544f504,
title = "Surface analysis of epitaxially grown GeSn alloys with Sn contents between 15% and 18%",
keywords = "GeSn alloy, phase separation, epitaxy",
author = "Lukas Kormos and Markus Kratzer and Konrad Kostecki and Michael Oehme and Tomas Sikola and Erich Kasper and J{\"o}rg Schulze and Christian Teichert",
year = "2017",
month = apr,
day = "1",
language = "English",
journal = "Surface and interface analysis",
issn = "0142-2421",
publisher = "John Wiley & Sons Ltd",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Surface analysis of epitaxially grown GeSn alloys with Sn contents between 15% and 18%
AU - Kormos, Lukas
AU - Kratzer, Markus
AU - Kostecki, Konrad
AU - Oehme, Michael
AU - Sikola, Tomas
AU - Kasper, Erich
AU - Schulze, Jörg
AU - Teichert, Christian
PY - 2017/4/1
Y1 - 2017/4/1
KW - GeSn alloy
KW - phase separation
KW - epitaxy
M3 - Article
JO - Surface and interface analysis
JF - Surface and interface analysis
SN - 0142-2421
ER -
