Correlation between internal states and creep resistance in metallic glass thin films
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In: Journal of applied physics, Vol. 129, No. 8, 085302, 28.02.2021.
Research output: Contribution to journal › Article › Research › peer-review
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TY - JOUR
T1 - Correlation between internal states and creep resistance in metallic glass thin films
AU - Li, M.
AU - Tan, J.
AU - Qin, X. M.
AU - Lu, D. H.
AU - Feng, Z. X.
AU - Li, C. J.
AU - Ketov, S. V.
AU - Calin, M.
AU - Eckert, J.
N1 - Publisher Copyright: © 2021 Author(s).
PY - 2021/2/28
Y1 - 2021/2/28
UR - http://www.scopus.com/inward/record.url?scp=85101755456&partnerID=8YFLogxK
U2 - 10.1063/5.0039754
DO - 10.1063/5.0039754
M3 - Article
AN - SCOPUS:85101755456
VL - 129
JO - Journal of applied physics
JF - Journal of applied physics
SN - 0021-8979
IS - 8
M1 - 085302
ER -