Correlation between internal states and creep resistance in metallic glass thin films

Research output: Contribution to journalArticleResearchpeer-review

Authors

  • M. Li
  • J. Tan
  • X. M. Qin
  • D. H. Lu
  • Z. X. Feng
  • C. J. Li
  • S. V. Ketov
  • M. Calin

External Organisational units

  • School of Materials Science and Engineering
  • Kunming University of Science and Technology
  • College of Materials Science and Engineering
  • Chongqing University
  • Österreichische Akademie der Wissenschaften
  • Institute for Complex Materials

Details

Original languageEnglish
Article number085302
JournalJournal of applied physics
Volume129
Issue number8
DOIs
Publication statusPublished - 28 Feb 2021