Rostislav Daniel

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Publications / Theses

  1. 2012
  2. Published

    Mesure de la conductivite thermique d'une couche de CrN par deux techniques de radiometrie photothermique

    Battaglia, J-L., Martan, J., Kusiak, A. & Daniel, R., 2012, Congres francais de thermique. p. 108-114

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  3. Published

    Microstructure and mechanical properties of nanocrystalline Al-Cr-B-N thin films

    Tritremmel, C., Daniel, R., Lechthaler, M., Rudigier, H., Polcik, P. & Mitterer, C., 2012, In: Surface & coatings technology. 213, p. 1-7

    Research output: Contribution to journal › Article › Research › peer-review

  4. Published

    Microstructure modifications of CrN coatings by pulsed bias sputtering

    Grasser, S., Daniel, R. & Mitterer, C., 2012, In: Surface & coatings technology. 206, p. 4666-4671

    Research output: Contribution to journal › Article › Research › peer-review

  5. Published

    Oxidation behavior of arc evaporated Al-Cr-Si-N thin films

    Tritremmel, C., Daniel, R., Mitterer, C., Mayrhofer, P. H., Lechthaler, M. & Polcik, P., 2012, In: Journal of vacuum science & technology / A (JVST). 30, p. 061501-1-061501-6

    Research output: Contribution to journal › Article › Research › peer-review

  6. Published

    Structure related stress gradients in thin nanocrystalline films revealed by X-ray nanodiffraction

    Daniel, R., Keckes, J. & Mitterer, C., 2012.

    Research output: Contribution to conference › Poster › Research › peer-review

  7. Published

    TEM characterization of CrN thin films epitaxially grown on MgO (001)

    Harzer, T. P., Kormout, K., Daniel, R., Mitterer, C., Dehm, G. & Zhang, Z. L., 2012.

    Research output: Contribution to conference › Poster › Research › peer-review

  8. Published

    Thermally treated hard coatings characterized by XRD coupled with four-point bending

    Steffenelli, M., Riedl, A., Bartosik, M., Daniel, R., Mitterer, C. & Keckes, J., 2012.

    Research output: Contribution to conference › Poster › Research › peer-review

  9. Published

    X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films

    Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G. A., Ecker, W., Vila-Comamala, J., David, C., Schoeder, S. & Burghammer, M., 2012, In: Scripta materialia. 67, p. 748-751

    Research output: Contribution to journal › Article › Research › peer-review

  10. 2011
  11. Published

    Advanced characterisation of the Cu-MgO interface structure by Cs-corrected high-resolution transmission electron microscopy

    Zhang, Z., Daniel, R., Dehm, G. & Mitterer, C., 2011.

    Research output: Contribution to conference › Poster › Research › peer-review

  12. Published

    Atomic and electronic characterization on the CrN/Cr/Si interfaces using CS-corrected HRTEM

    Zhang, Z., Daniel, R. & Mitterer, C., 2011.

    Research output: Contribution to conference › Poster › Research › peer-review

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Phone: 4228

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