Unravelling local environments in mixed TiO2–SiO2 thin films by XPS and ab initio calculations
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In: Applied surface science, Vol. 2020, No. 510, 2020, p. 1-11.
Research output: Contribution to journal › Article › Research › peer-review
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TY - JOUR
T1 - Unravelling local environments in mixed TiO2–SiO2 thin films by XPS and ab initio calculations
AU - Ondračka, Pavel
AU - Necas, David
AU - Carette, Michèle
AU - Elisabeth, Stephane
AU - Holec, David
AU - Granier, Agnès
AU - Goullet, Antoine
AU - Zajickkova, Lenka
AU - Richard-Plouet, Mireille
PY - 2020
Y1 - 2020
U2 - 10.1016/j.apsusc.2019.145056
DO - 10.1016/j.apsusc.2019.145056
M3 - Article
VL - 2020
SP - 1
EP - 11
JO - Applied surface science
JF - Applied surface science
SN - 0169-4332
IS - 510
ER -