Pattern decomposition for residual stress analysis: a generalization taking into consideration elastic anisotropy and extension to higher-symmetry Laue classes
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Pattern decomposition for residual stress analysis: a generalization taking into consideration elastic anisotropy and extension to higher-symmetry Laue classes. / Schoderböck, Peter; Leibenguth, Peter; Tkadletz, Michael.
In: Journal of applied crystallography, Vol. 50, 2017, p. 1-10.
In: Journal of applied crystallography, Vol. 50, 2017, p. 1-10.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
Schoderböck, P, Leibenguth, P & Tkadletz, M 2017, 'Pattern decomposition for residual stress analysis: a generalization taking into consideration elastic anisotropy and extension to higher-symmetry Laue classes', Journal of applied crystallography, vol. 50, pp. 1-10.
APA
Schoderböck, P., Leibenguth, P., & Tkadletz, M. (2017). Pattern decomposition for residual stress analysis: a generalization taking into consideration elastic anisotropy and extension to higher-symmetry Laue classes. Journal of applied crystallography, 50, 1-10.
Vancouver
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Bibtex - Download
@article{83e8ad13770d4c7a812217e76974f283,
title = "Pattern decomposition for residual stress analysis: a generalization taking into consideration elastic anisotropy and extension to higher-symmetry Laue classes",
author = "Peter Schoderb{\"o}ck and Peter Leibenguth and Michael Tkadletz",
year = "2017",
language = "English",
volume = "50",
pages = "1--10",
journal = "Journal of applied crystallography",
issn = "1600-5767",
publisher = "International Union of Crystallography",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Pattern decomposition for residual stress analysis: a generalization taking into consideration elastic anisotropy and extension to higher-symmetry Laue classes
AU - Schoderböck, Peter
AU - Leibenguth, Peter
AU - Tkadletz, Michael
PY - 2017
Y1 - 2017
M3 - Article
VL - 50
SP - 1
EP - 10
JO - Journal of applied crystallography
JF - Journal of applied crystallography
SN - 1600-5767
ER -