Markus Kratzer

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Publications / Theses

  1. 2010
  2. Published

    A theoretical study of Zn adsorption and desorption on a Pd(111) substrate

    Koch, H. P., Bako, I., Weirum, G., Kratzer, M. & Schennach, R., 2010, In: Surface Science. 604, p. 926-931

    Research output: Contribution to journal › Article › Research › peer-review

  3. Published

    Combined C-AFM/PFM investigations of ZnO nanorods

    Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  4. Published

    Complementary electrical characterization of arrowhead defects in GaInP thin films grown on Ge: KPFM and C-AFM exploration

    Beinik, I., Galiana, B., Kratzer, M., Rey-Stolle, I., Algora, C., Tejedor, P. & Teichert, C., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  5. Published

    Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy

    Shen, Q., Hlawacek, G., Kratzer, M., Flesch, H-G., Potocar, T., Resel, R., Winkler, A. & Teichert, C., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  6. Published

    Electrical, electro-mechanical and opto-electronical properties of ZnO nanorods studied by AFM technique

    Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  7. Published

    Growth of para-hexaphenyl (6P) on silicon oxide by hot wall epitaxy

    Kratzer, M., Shen, Q. & Teichert, C., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  8. Published

    Growth of para-hexaphenyl (p6P) on SiO2 by hot wall epitaxy

    Kratzer, M., Shen, Q. & Teichert, C., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  9. Published

    Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge

    Beinik, I., Galiana, B., Kratzer, M., Teichert, C., Rey-Stolle, I., Algora, C. & Tejedor, P., 2010, In: Journal of vacuum science & technology / B (JVST). 28, p. C5G5-C5G10

    Research output: Contribution to journal › Article › Research › peer-review

  10. 2009
  11. Published

    Characterization of single ZnO nanorods by conductive atomic force microscopy

    Kratzer, M., Beinik, I., Teichert, C., Wang, L., Brauer, G. & Anwand, W., 2009.

    Research output: Contribution to conference › Poster › Research › peer-review

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Phone: 4666

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