Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy

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Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy. / Kondratenko, S. V.; Lysenko, V. S.; Kozyrev, Yu N. et al.
in: Applied surface science, Jahrgang 389, 15.12.2016, S. 783-789.

Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)

Harvard

Kondratenko, SV, Lysenko, VS, Kozyrev, YN, Kratzer, M, Storozhuk, DP, Iliash, SA, Czibula, C & Teichert, C 2016, 'Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy', Applied surface science, Jg. 389, S. 783-789. https://doi.org/10.1016/j.apsusc.2016.07.148

APA

Kondratenko, S. V., Lysenko, V. S., Kozyrev, Y. N., Kratzer, M., Storozhuk, D. P., Iliash, S. A., Czibula, C., & Teichert, C. (2016). Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy. Applied surface science, 389, 783-789. https://doi.org/10.1016/j.apsusc.2016.07.148

Vancouver

Kondratenko SV, Lysenko VS, Kozyrev YN, Kratzer M, Storozhuk DP, Iliash SA et al. Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy. Applied surface science. 2016 Dez 15;389:783-789. doi: 10.1016/j.apsusc.2016.07.148

Author

Kondratenko, S. V. ; Lysenko, V. S. ; Kozyrev, Yu N. et al. / Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy. in: Applied surface science. 2016 ; Jahrgang 389. S. 783-789.

Bibtex - Download

@article{d08ed61018be44fb88820c863643d149,
title = "Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy",
keywords = "Carrier lifetime, Heterostructures, Quantum dots, Recombination processes",
author = "Kondratenko, {S. V.} and Lysenko, {V. S.} and Kozyrev, {Yu N.} and M. Kratzer and Storozhuk, {D. P.} and Iliash, {S. A.} and C. Czibula and C. Teichert",
year = "2016",
month = dec,
day = "15",
doi = "10.1016/j.apsusc.2016.07.148",
language = "English",
volume = "389",
pages = "783--789",
journal = "Applied surface science",
issn = "0169-4332",
publisher = "Elsevier",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy

AU - Kondratenko, S. V.

AU - Lysenko, V. S.

AU - Kozyrev, Yu N.

AU - Kratzer, M.

AU - Storozhuk, D. P.

AU - Iliash, S. A.

AU - Czibula, C.

AU - Teichert, C.

PY - 2016/12/15

Y1 - 2016/12/15

KW - Carrier lifetime

KW - Heterostructures

KW - Quantum dots

KW - Recombination processes

UR - http://www.scopus.com/inward/record.url?scp=84982840776&partnerID=8YFLogxK

U2 - 10.1016/j.apsusc.2016.07.148

DO - 10.1016/j.apsusc.2016.07.148

M3 - Article

AN - SCOPUS:84982840776

VL - 389

SP - 783

EP - 789

JO - Applied surface science

JF - Applied surface science

SN - 0169-4332

ER -

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