Development and application of a heated in-situ SEM micro-testing device
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in: Measurement, Jahrgang 110, 01.11.2017, S. 356-366.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
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TY - JOUR
T1 - Development and application of a heated in-situ SEM micro-testing device
AU - Fritz, R.
AU - Kiener, D.
PY - 2017/11/1
Y1 - 2017/11/1
KW - Elevated temperature
KW - Fracture toughness
KW - In-situ testing
KW - Micromechanics
KW - Ultrafine-grained microstructure
UR - http://www.scopus.com/inward/record.url?scp=85024499193&partnerID=8YFLogxK
U2 - 10.1016/j.measurement.2017.07.012
DO - 10.1016/j.measurement.2017.07.012
M3 - Article
AN - SCOPUS:85024499193
VL - 110
SP - 356
EP - 366
JO - Measurement
JF - Measurement
SN - 0263-2241
ER -