Selective interface toughness measurements of layered thin films
Research output: Contribution to journal › Article › Research › peer-review
Standard
Selective interface toughness measurements of layered thin films. / Konetschnik, Ruth; Daniel, Rostislav; Brunner, R et al.
In: AIP Advances, No. 7, 2017, p. 035307-1.
In: AIP Advances, No. 7, 2017, p. 035307-1.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
Konetschnik, R, Daniel, R, Brunner, R & Kiener, D 2017, 'Selective interface toughness measurements of layered thin films', AIP Advances, no. 7, pp. 035307-1. https://doi.org/10.1063/1.4978337
APA
Konetschnik, R., Daniel, R., Brunner, R., & Kiener, D. (2017). Selective interface toughness measurements of layered thin films. AIP Advances, (7), 035307-1. https://doi.org/10.1063/1.4978337
Vancouver
Konetschnik R, Daniel R, Brunner R, Kiener D. Selective interface toughness measurements of layered thin films. AIP Advances. 2017;(7):035307-1. doi: http://dx.doi.org/10.1063/1.4978337
Author
Bibtex - Download
@article{25548c7240b34eb68b3853546df307cc,
title = "Selective interface toughness measurements of layered thin films",
author = "Ruth Konetschnik and Rostislav Daniel and R Brunner and Daniel Kiener",
year = "2017",
doi = "http://dx.doi.org/10.1063/1.4978337",
language = "English",
pages = "035307--1",
journal = "AIP Advances",
issn = "2158-3226",
publisher = "American Institute of Physics Publising LLC",
number = "7",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Selective interface toughness measurements of layered thin films
AU - Konetschnik, Ruth
AU - Daniel, Rostislav
AU - Brunner, R
AU - Kiener, Daniel
PY - 2017
Y1 - 2017
U2 - http://dx.doi.org/10.1063/1.4978337
DO - http://dx.doi.org/10.1063/1.4978337
M3 - Article
SP - 35307
EP - 35301
JO - AIP Advances
JF - AIP Advances
SN - 2158-3226
IS - 7
ER -
