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2021
Published
Characterization of the gamma-loop in the Fe-P system by coupling DSC and HT-LSCM with complementary in-situ experimental techniques
Bernhard, M., Fuchs, N., Presoly, P., Angerer, P., Friessnegger, B. & Bernhard, C., Apr 2021, In: Materials characterization. 174
Research output: Contribution to journal › Article › Research › peer-review
2020
Published
Transient phase fraction and dislocation density estimation from in-situ X-ray diffraction data with a low signal-to-noise ratio using a Bayesian approach to the Rietveld analysis
Wiessner, M., Angerer, P., van der Zwaag, S. & Gamsjäger, E., 25 Dec 2020, In: Materials characterization. 172.2021, February, 9 p., 110860.
Research output: Contribution to journal › Article › Research › peer-review
2016
Published
Curvature determination of embedded silicon chips by in situ rocking curve X-ray diffraction measurements at elevated temperatures
Angerer, P., Schöngrundner, R., Macurova, K., Wiessner, M. & Keckes, J., 1 Dec 2016, In: Powder diffraction. 31, 4, p. 267-273 7 p.
Research output: Contribution to journal › Article › Research › peer-review
Published
Thermal stability of residual stresses in Ti-6Al-4V components
Stanojevic, A., Angerer, P. & Oberwinkler, B., 14 Apr 2016, In: IOP Conference Series: Materials Science and Engineering. 119, 1, 012007.
Research output: Contribution to journal › Conference article › peer-review

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