Scratch induced thin film buckling for quantitative adhesion measurements
Research output: Contribution to journal › Article › Research › peer-review
Authors
Organisational units
External Organisational units
- Erich Schmid Institute of Materials Science
- Infineon Technologies AG Austria
Details
| Original language | English |
|---|---|
| Pages (from-to) | 203-211 |
| Journal | Materials and Design |
| Volume | 115 |
| Publication status | Published - 2018 |
