Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy

Research output: Contribution to journalArticleResearchpeer-review

Authors

  • S. V. Kondratenko
  • V. S. Lysenko
  • Yu N. Kozyrev
  • D. P. Storozhuk
  • S. A. Iliash

External Organisational units

  • Taras Shevchenko National University of Kyiv
  • V. Lashkaryov Institute of Semiconductor Physics
  • O.O. Chuiko Institute of Surface Chemistry

Details

Original languageEnglish
Pages (from-to)783-789
Number of pages7
JournalApplied surface science
Volume389
DOIs
Publication statusPublished - 15 Dec 2016