Electrically reversible cracks in an intermetallic film controlled by an electric field

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Electrically reversible cracks in an intermetallic film controlled by an electric field. / Liu, Z.Q. ; Liu, J.H.; Biegalski, M.D. et al.
In: Nature Communications, Vol. 41.2018, No. 9, 9, 03.01.2018.

Research output: Contribution to journal › Article › Research › peer-review

Harvard

Liu, ZQ, Liu, JH, Biegalski, MD, Hu, J-M, Shang, SL, Ji, Y, Wang, JM, Hsu, SL, Wong, AT, Cordill, M, Gludovatz, B, Marker, C, Yan, H, Feng, ZX, You, L, Lin, MW, Ward, TZ, Liu, ZK, Jiang, CB, Chen, LQ, Ritchie, RO, Christen, HM & Ramesh, R 2018, 'Electrically reversible cracks in an intermetallic film controlled by an electric field', Nature Communications, vol. 41.2018, no. 9, 9. https://doi.org/10.1038/s41467-017-02454-8

APA

Liu, Z. Q., Liu, J. H., Biegalski, M. D., Hu, J.-M., Shang, S. L., Ji, Y., Wang, J. M., Hsu, S. L., Wong, A. T., Cordill, M., Gludovatz, B., Marker, C., Yan, H., Feng, Z. X., You, L., Lin, M. W., Ward, T. Z., Liu, Z. K., Jiang, C. B., ... Ramesh, R. (2018). Electrically reversible cracks in an intermetallic film controlled by an electric field. Nature Communications, 41.2018(9), Article 9. https://doi.org/10.1038/s41467-017-02454-8

Vancouver

Liu ZQ, Liu JH, Biegalski MD, Hu JM, Shang SL, Ji Y et al. Electrically reversible cracks in an intermetallic film controlled by an electric field. Nature Communications. 2018 Jan 3;41.2018(9):9. doi: 10.1038/s41467-017-02454-8

Author

Liu, Z.Q. ; Liu, J.H. ; Biegalski, M.D. et al. / Electrically reversible cracks in an intermetallic film controlled by an electric field. In: Nature Communications. 2018 ; Vol. 41.2018, No. 9.

Bibtex - Download

@article{a804ca0eed2c44298621224230022332,
title = "Electrically reversible cracks in an intermetallic film controlled by an electric field",
author = "Z.Q. Liu and J.H. Liu and M.D. Biegalski and J.-M. Hu and S.L. Shang and Y. Ji and J.M. Wang and S.L. Hsu and A.T. Wong and Megan Cordill and B. Gludovatz and C. Marker and H. Yan and Z.X. Feng and L. You and M.W. Lin and T.Z. Ward and Z.K. Liu and C.B. Jiang and L.Q. Chen and R.O. Ritchie and H.M. Christen and R. Ramesh",
year = "2018",
month = jan,
day = "3",
doi = "10.1038/s41467-017-02454-8",
language = "English",
volume = "41.2018",
journal = "Nature Communications",
issn = "2041-1723",
publisher = "Nature Publishing Group",
number = "9",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Electrically reversible cracks in an intermetallic film controlled by an electric field

AU - Liu, Z.Q.

AU - Liu, J.H.

AU - Biegalski, M.D.

AU - Hu, J.-M.

AU - Shang, S.L.

AU - Ji, Y.

AU - Wang, J.M.

AU - Hsu, S.L.

AU - Wong, A.T.

AU - Cordill, Megan

AU - Gludovatz, B.

AU - Marker, C.

AU - Yan, H.

AU - Feng, Z.X.

AU - You, L.

AU - Lin, M.W.

AU - Ward, T.Z.

AU - Liu, Z.K.

AU - Jiang, C.B.

AU - Chen, L.Q.

AU - Ritchie, R.O.

AU - Christen, H.M.

AU - Ramesh, R.

PY - 2018/1/3

Y1 - 2018/1/3

U2 - 10.1038/s41467-017-02454-8

DO - 10.1038/s41467-017-02454-8

M3 - Article

VL - 41.2018

JO - Nature Communications

JF - Nature Communications

SN - 2041-1723

IS - 9

M1 - 9

ER -

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