Cu diffusion in single-crystal and polycrystalline TiN barrier layers: A high-resolution experimental study supported by first-principles calculations
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In: Journal of applied physics, Vol. 118, 2015, p. 085307-1 - 085307-11.
Research output: Contribution to journal › Article › Research › peer-review
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TY - JOUR
T1 - Cu diffusion in single-crystal and polycrystalline TiN barrier layers: A high-resolution experimental study supported by first-principles calculations
AU - Mühlbacher, Marlene
AU - Bochkarev, Anton S.
AU - Mendez Martin, Francisca
AU - Sartory, Bernhard
AU - Chitu, Livia
AU - Popov, Maxim
AU - Puschnig, Peter
AU - Spitaler, Jürgen
AU - Ding, Hong
AU - Schalk, Nina
AU - Lu, Jun
AU - Hultman, Lars
AU - Mitterer, Christian
PY - 2015
Y1 - 2015
M3 - Article
VL - 118
SP - 085307-1 - 085307-11
JO - Journal of applied physics
JF - Journal of applied physics
SN - 0021-8979
ER -