Auger and X-ray photoelectron spectroscopy on lithiated HOPG
Research output: Contribution to journal › Article › Research › peer-review
Standard
Auger and X-ray photoelectron spectroscopy on lithiated HOPG. / Hoffmann, M.; Oswald, S.; Zier, M. et al.
In: Surface and interface analysis, Vol. 48, No. 7, 01.07.2016, p. 501-504.
In: Surface and interface analysis, Vol. 48, No. 7, 01.07.2016, p. 501-504.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
Hoffmann, M, Oswald, S, Zier, M & Eckert, J 2016, 'Auger and X-ray photoelectron spectroscopy on lithiated HOPG', Surface and interface analysis, vol. 48, no. 7, pp. 501-504. https://doi.org/10.1002/sia.6008
APA
Hoffmann, M., Oswald, S., Zier, M., & Eckert, J. (2016). Auger and X-ray photoelectron spectroscopy on lithiated HOPG. Surface and interface analysis, 48(7), 501-504. https://doi.org/10.1002/sia.6008
Vancouver
Hoffmann M, Oswald S, Zier M, Eckert J. Auger and X-ray photoelectron spectroscopy on lithiated HOPG. Surface and interface analysis. 2016 Jul 1;48(7):501-504. doi: 10.1002/sia.6008
Author
Bibtex - Download
@article{cb6913fa67274d1aba59920c5fdd66bc,
title = "Auger and X-ray photoelectron spectroscopy on lithiated HOPG",
keywords = "AES, lithiated HOPG, lithium, XPS",
author = "M. Hoffmann and S. Oswald and M. Zier and J. Eckert",
year = "2016",
month = jul,
day = "1",
doi = "10.1002/sia.6008",
language = "English",
volume = "48",
pages = "501--504",
journal = "Surface and interface analysis",
issn = "0142-2421",
publisher = "John Wiley & Sons Ltd",
number = "7",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Auger and X-ray photoelectron spectroscopy on lithiated HOPG
AU - Hoffmann, M.
AU - Oswald, S.
AU - Zier, M.
AU - Eckert, J.
PY - 2016/7/1
Y1 - 2016/7/1
KW - AES
KW - lithiated HOPG
KW - lithium
KW - XPS
UR - http://www.scopus.com/inward/record.url?scp=84979725344&partnerID=8YFLogxK
U2 - 10.1002/sia.6008
DO - 10.1002/sia.6008
M3 - Article
AN - SCOPUS:84979725344
VL - 48
SP - 501
EP - 504
JO - Surface and interface analysis
JF - Surface and interface analysis
SN - 0142-2421
IS - 7
ER -
