A versatile atomic force microscope integrated with a scanning electron microscope
Research output: Contribution to journal › Article › Research › peer-review
Standard
A versatile atomic force microscope integrated with a scanning electron microscope. / Kreith, Joseph; Strunz, T. ; Fantner, E.J. et al.
In: Review of scientific instruments, Vol. 88, No. 5, 053704, 2017.
In: Review of scientific instruments, Vol. 88, No. 5, 053704, 2017.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
Kreith, J, Strunz, T, Fantner, EJ, Fantner, GE & Cordill, M 2017, 'A versatile atomic force microscope integrated with a scanning electron microscope', Review of scientific instruments, vol. 88, no. 5, 053704.
APA
Kreith, J., Strunz, T., Fantner, E. J., Fantner, G. E., & Cordill, M. (2017). A versatile atomic force microscope integrated with a scanning electron microscope. Review of scientific instruments, 88(5), Article 053704.
Vancouver
Kreith J, Strunz T, Fantner EJ, Fantner GE, Cordill M. A versatile atomic force microscope integrated with a scanning electron microscope. Review of scientific instruments. 2017;88(5):053704.
Author
Bibtex - Download
@article{d70dc6e407a24d4ebe3f04e0b75b3a84,
title = "A versatile atomic force microscope integrated with a scanning electron microscope",
author = "Joseph Kreith and T. Strunz and E.J. Fantner and G.E. Fantner and Megan Cordill",
year = "2017",
language = "English",
volume = "88",
journal = "Review of scientific instruments",
issn = "0034-6748",
publisher = "American Institute of Physics Publising LLC",
number = "5",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - A versatile atomic force microscope integrated with a scanning electron microscope
AU - Kreith, Joseph
AU - Strunz, T.
AU - Fantner, E.J.
AU - Fantner, G.E.
AU - Cordill, Megan
PY - 2017
Y1 - 2017
M3 - Article
VL - 88
JO - Review of scientific instruments
JF - Review of scientific instruments
SN - 0034-6748
IS - 5
M1 - 053704
ER -
