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Paul Angerer

(Former)

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Characterization of the gamma-loop in the Fe-P system by coupling DSC and HT-LSCM with complementary in-situ experimental techniques
Research output: Contribution to journal › Article › Research › peer-review
Transient phase fraction and dislocation density estimation from in-situ X-ray diffraction data with a low signal-to-noise ratio using a Bayesian approach to the Rietveld analysis
Research output: Contribution to journal › Article › Research › peer-review
Curvature determination of embedded silicon chips by in situ rocking curve X-ray diffraction measurements at elevated temperatures
Research output: Contribution to journal › Article › Research › peer-review

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