Marlene Mühlbacher
(Former)
Publications / Theses
- 2017
- Published
Atomic origin for rejuvenation of a Zr-based metallic glass at cryogenic temperature
Bian, X. L., Wang, G., Yi, J., Jia, Y. D., Bednarčík, J., Zhai, Q. J., Kaban, I., Sarac, B., Mühlbacher, M., Spieckermann, F., Keckes, J. & Eckert, J., 25 Sept 2017, In: Journal of alloys and compounds. 718, p. 254-259 6 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Deformation Mechanisms in Magnetron Sputtered Thin Film Metallic Glasses
Mühlbacher, M., Gammer, C., Konetschnik, R., Schöberl, T., Mitterer, C. & Eckert, J., Mar 2017.Research output: Contribution to conference › Poster › Research
- 2016
- Published
TiN diffusion barrier failure by the formation of Cu3Si investigated by electron microscopy and atom probe tomography
Mühlbacher, M., Greczynski, G., Sartory, B., Mendez Martin, F., Schalk, N., Lu, J., Hultman, L. & Mitterer, C., 19 Feb 2016, In: Journal of Vacuum Science and Technology B, JVSTB. 34, 2, p. 1-8 8 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Diffusion Studies in the TiN/Cu Bilayer System and Beyond
Mühlbacher, M., Mendez Martin, F., Sartory, B., Greczynski, G., Lu, J., Schalk, N., Hultman, L. & Mitterer, C., 2016.Research output: Contribution to conference › Presentation › Research › peer-review
- 2015
- Published
Copper diffusion into single-crystalline TiN studied by transmission electron microscopy and atom probe tomography
Mühlbacher, M., Mendez Martin, F., Sartory, B., Schalk, N., Keckes, J., Lu, J., Hultman, L. & Mitterer, C., 2015, In: Thin solid films. 574, p. 103-109Research output: Contribution to journal › Article › Research › peer-review
- Published
Cu diffusion in single-crystal and polycrystalline TiN barrier layers: A high-resolution experimental study supported by first-principles calculations
Mühlbacher, M., Bochkarev, A. S., Mendez Martin, F., Sartory, B., Chitu, L., Popov, M., Puschnig, P., Spitaler, J., Ding, H., Schalk, N., Lu, J., Hultman, L. & Mitterer, C., 2015, In: Journal of applied physics. 118, p. 085307-1 - 085307-11Research output: Contribution to journal › Article › Research › peer-review
- Published
Diffusion in the Cu/TiN thin film system studied by atom probe tomography correlated with transmission electron microscopy and first-principles calculations
Mühlbacher, M., Mendez Martin, F., Lu, J., Schalk, N., Hultman, L. & Mitterer, C., 2015.Research output: Contribution to conference › Presentation › Research › peer-review
- Published
Evaluation of TiN diffusion barrier layers with different microstructures by transmission electron microscopy and atom probe tomography
Mühlbacher, M., Mendez Martin, F., Sartory, B., Chitu, L., Lu, J., Schalk, N., Keckes, J., Hultman, L. & Mitterer, C., 2015.Research output: Contribution to conference › Presentation › Research › peer-review
- Published
Functional thin films for display and microelectronics applications
Mitterer, C., Jörg, T., Franz, R., Mühlbacher, M., Sartory, B., Mendez Martin, F. & Schalk, N., 2015, In: Berg- und hüttenmännische Monatshefte : BHM. 160, 5, p. 231-234Research output: Contribution to journal › Article › Research › peer-review
- Published
Interdiffusion within model TiN/Cu and TiTaN/Cu systems synthesized by combinatorial thin film deposition
Mühlbacher, M., 2015Research output: Thesis › Doctoral Thesis