Karl Christian Teichert
Publications / Theses
- Published
Annual Report 2007, FWF-NFN Projekt S9707-N08
Teichert, C., 2008Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
A Novel UV Tunable and Patternable Polyaniline Derivate as a Charge Injection Layer in OLEDs
Simone, R., Grießer, T., Edler, M., Kern, W., Rath, T., Trimmel, G., Pavitschitz, A., Teichert, C., Simbrunner, C., Schwabegger, G. & Sitter, H., 2016.Research output: Contribution to conference › Poster › Research
- Published
Anti-adhesive layers on stainless steel using thermally stable dipodal perfluoroalkyl silanes
Kaynak, B., Alpan, C., Kratzer, M., Ganser, C., Teichert, C. & Kern, W., 2017, In: Applied surface science. 416, p. 824-833Research output: Contribution to journal › Article › Research › peer-review
- Published
Application of conductive AFM technique to measure electrical conductance of tribofilms
Pondicherry, K., Beinik, I., Grün, F., Godor, I. & Teichert, C., 2009, Proceedings of 26th Danubia-Adria Symposium on Advances in Experimental Mechanics. p. 205-206Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Application of conductive AFM technique to measure electrical conductance of tribofilms
Pondicherry, K., Beinik, I., Grün, F., Godor, I. & Teichert, C., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Application of the page-equation on flat shaped viscose fibre handsheets
Weber, F., Ganser, C., Teichert, C., Schennach, R., Bernt, I. & Eckhart, R., 2014, In: Cellulose. 21, p. 3715-3724Research output: Contribution to journal › Article › Research › peer-review
- Published
Atomic force microscopy as a tool to characterize single pulp fibers and fiber-fiber bonds
Ganser, C., Schmied, F., Schennach, R., Hirn, U. & Teichert, C., 2012.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Atomic Force Microscopy as a Tool to Explore Triboelectrostatic Phenomena in Mineral Processing
Mirkowska, M., Kratzer, M., Teichert, C. & Flachberger, H., 2014, In: Chemie-Ingenieur-Technik. 86, p. 857-864Research output: Contribution to journal › Article › Research › peer-review
- Published
Atomic force microscopy as metrology tool for identificationof phases in two- or multi-component polymer systems
Weber, A., Resch, K. & Teichert, C., 2010, 10th Austrian Polymer Meeting and 2nd Joint Austrian-Slovenian Polymer Meeting. p. 64-67Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Atomic force microscopy based manipulation of graphene using dynamic plowing lithography
Vasić, B., Kratzer, M., Matković, A., Nevosad, A., Ralević, U., Jovanović, D., Ganser, C., Teichert, C. & Gajić, R., 2013, In: Nanotechnology. 24, p. 015303-015303Research output: Contribution to journal › Article › Research › peer-review