Igor Beinik

(Former)

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Publications / Theses

  1. Published

    Surface planarization and masked ion-beam structuring of YBa2Cu3O7 thin films

    Pedarnig, J. D., Siraj, K., Bodea, M. A., Puica, I., Lang, W., Kolarova, R., Bauer, P., Haselgrübler, K., Hasenfuss, C., Beinik, I. & Teichert, C., 2010, In: Thin solid films. 518, p. 7075-7080

    Research output: Contribution to journal › Article › Research › peer-review

  2. Published

    Application of conductive AFM technique to measure electrical conductance of tribofilms

    Pondicherry, K., Beinik, I., Grün, F., Godor, I. & Teichert, C., 2009, Proceedings of 26th Danubia-Adria Symposium on Advances in Experimental Mechanics. p. 205-206

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  3. Published

    Application of conductive AFM technique to measure electrical conductance of tribofilms

    Pondicherry, K., Beinik, I., Grün, F., Godor, I. & Teichert, C., 2009.

    Research output: Contribution to conference › Poster › Research › peer-review

  4. Published

    Scanning Probe Microscopy-based Characterization of ZnO Nanorods

    Teichert, C., Hou, Y., Beinik, I., Chen, Y., Djuricis, A., Anwand, W. & Brauer, G., 2010, Abstract CD IEEE International NanoElectronics Conference (INEC 2010). p. 438-439

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  5. Published

    Conductive Atomic-Force Microscopy Investigation of Nanostructures in Microelectronics

    Teichert, C. & Beinik, I., 2011, Scanning Probe Microscopy in Nanoscience and Nanotechnology 2. p. 691-721

    Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research

  6. Published

    Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)

    Tejedor, P., Díez-Merino, L., Beinik, I. & Teichert, C., 2009, In: Applied physics letters. 95, p. 123103-1-123103-3

    Research output: Contribution to journal › Article › Research › peer-review

  7. Published

    Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz

    Tejedor, P., Vázquez, L., Díez-Merino, L., Beinik, I. & Teichert, C., 2008.

    Research output: Contribution to conference › Poster › Research › peer-review

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