Daniel Kiener
Publications / Theses
- 2006
- Published
Characterization of mechanical properties on the micron size. Bericht 2
Kiener, D. & Dehm, G., 2006Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Characterization of mechanical properties on the micron size. Bericht 3
Kiener, D. & Dehm, G., 2006Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Characterization of mechanical properties on the micron size. Bericht 4
Kiener, D. & Dehm, G., 2006Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Determination of Mechanical Properties of Copper at the Micron Scale
Kiener, D., Motz, C., Schöberl, T., Jenko, M. & Dehm, G., 2006, In: Advanced Engineering Materials. 8, p. 1119-1125Research output: Contribution to journal › Article › Research › peer-review
- Published
In-Situ compression tests on micron-sized copper pillars
Kiener, D., Motz, C. & Dehm, G., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- Published
In-situ TEM tensile testing of thin Au films: A transition in deformation mechanism
Oh, S. H., Kiener, D., Legros, M., Gruber, P., Arzt, E. & Dehm, G., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Micron beam bending and compression tests - micromechanical properties of copper
Motz, C., Kiener, D., Schöberl, T. & Dehm, G., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Microstructural evolution of the deformed volume beneath microindents in tungsten and copper
Kiener, D., Pippan, R., Motz, C. & Kreuzer, E., 2006, In: Acta materialia. 54, p. 2801-2811Research output: Contribution to journal › Article › Research › peer-review
- Published
Microstructural investigation of the deformation zone below nanoindents in copper, silver and nickel
Rester, M., Kiener, D., Kreuzer, H., Dehm, G. & Motz, C., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- 2005
- Published
Fokussierte Ionenstrahl-Technik (FIB) in der Mikro- und Nanomechanik
Motz, C., Kiener, D., Schöberl, T., Pippan, R. & Dehm, G., 2005, Handbuch der Nanoanalytik. p. 162-163Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research