Montanuniversität
Organisational unit: University
29861 - 29870 out of 30,152Page size: 10
Publications / Theses
- Published
X-ray characterization of semiconductor nanostructures
Holy, V., Buljan, M. & Lechner, R. T., 2011, In: Semiconductor science and technology. 26, p. 064002/1- 064002/7Research output: Contribution to journal › Article › Research › peer-review
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X-Ray computed tomography – Potenials, expectations and limits in practical application
Schindelbacher, G., Pabel, T. & Geier, G., 2007, In: Casting plant and technology international. p. 34-41Research output: Contribution to journal › Article › Research › peer-review
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X-ray Curing of Organic Bonded High Temperature Resistant Ceramics
Puchleitner, R., 2016Research output: Thesis › Doctoral Thesis
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X-ray diffraction analysis of three-dimensional residual stress fields reveals origins of thermal fatigue in uncoated and coated steel
Kirchlechner, C., Martinschitz, K. J., Daniel, R., Mitterer, C., Donges, J., Rothkirch, A., Klaus, M., Genzel, C. & Keckes, J., 2010, In: Scripta materialia. 62, p. 774-777Research output: Contribution to journal › Article › Research › peer-review
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X-ray Diffraction Computed Nanotomography Applied to Solve the Structure of Hierarchically Phase-Separated Metallic Glass
Stoica, M., Sarac, B., Spieckermann, F., Wright, J., Gammer, C., Han, J., Gostin, P. F., Eckert, J. & Löffler, J. F., 29 Jan 2021, In: ACS nano.Research output: Contribution to journal › Article › Research › peer-review
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X-ray diffraction of Pentacene on organic dielectrics
Moser, A., Flesch, H.-G., Neuhold, A., Edler, M., Grießer, T., Marchl, M., Trimmel, G., Golubkov, A., Haase, A., Smilgies, D.-M., Zojer, E. & Resel, R., 2010.Research output: Contribution to conference › Poster › Research › peer-review
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X-ray diffraction study of anthracene under high pressure
Oehzelt, M., Resel, R., Hummer, K., Puschnig, P., Draxl, C. & Nakayama, A., 2003, In: Synthetic Metals. 137, p. 913-914Research output: Contribution to journal › Article › Research › peer-review
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X-ray elastic constants determined by the combination of the sin² psi and substrate-curvature methods
Eiper, E., Martinschitz, K.-J., Gerlach, J. W., Lackner, J. M., Zizak, I., Darowski, N. & Keckes, J., 2005, In: Zeitschrift für Metallkunde : international journal of materials research and advanced techniques. 96, p. 1069-1073Research output: Contribution to journal › Article › Research › peer-review
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X-ray fluorescence sorting of non-ferrous metal fractions from municipal solid waste incineration bottom ash processing depending on particle surface properties
Pfandl, K., Küppers, B., Scheiber, S., Stockinger, G., Holzer, J., Pomberger, R., Antrekowitsch, H. & Höllen, D., 1 Feb 2020, In: Waste management & research. 38, 2, p. 111 - 121 11 p.Research output: Contribution to journal › Article › Research › peer-review
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X-ray induced cationic curing of epoxy-bonded composites
Puchleitner, R., Rieß, G. & Kern, W., 2017, In: European polymer journal. 91, p. 31-45Research output: Contribution to journal › Article › Research › peer-review
