Montanuniversität
Organisational unit: University
Publications / Theses
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Wurzeln und analytische Iteration formal-biholomorpher Abbildungen
Kräuter, A. R., 1980, In: Berichte der Mathematisch-Statistischen Sektion im Forschungszentrum Graz. 123, p. 1-79Research output: Contribution to journal › Article › Research › peer-review
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Wzrost molekul para-sexiphenylu na zmodykowanej wiazka jonowa powierzchni TiO2 (110)
Wrana, D., Kratzer, M., Teichert, C. & Krok, F., 2012.Research output: Contribution to conference › Poster › Research › peer-review
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X-alloys: A new generation of aluminum alloys
Stemper, L., 20 Sept 2020.Research output: Contribution to conference › Poster › Research
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XIV.Medunarodni Simpozij Gospodarenje Otpadom Zagreb 2016
Sarc, R. & Pomberger, R., 28 Nov 2016, XIV.Medunarodni Simpozij Gospodarenje Otpadom Zagreb 2016. Anic Vucinin, A. (ed.). Sv. I. Zelina, p. 56 - 57 13 p.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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X-Legierungen: Ein großer Schritt in Richtung Einheitslegierung
Stemper, L., 2020, AluReport. Vol. 02.2020. p. 40-43Research output: Chapter in Book/Report/Conference proceeding › Other chapter contribution › Research
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xP-frag, a distribution-free model to predict blast fragmentation
Sanchidrián, J. A. & Ouchterlony, F., 29 Jan 2017, Proc 43rd ISEE Conference on Explosives and Blasting Technique. Cleveland, OH, Vol. 43. p. 265-280 16 p.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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xP-frag: a new model to predict fragmentation from blasting
Sanchidrián, J. A. & Ouchterlony, F., 2017, APS Blasting 5; New development on engineerign blasting: Proc 5th Asia-Pacific Symposium on Blasting Techniques . Wang, X. (ed.). Beijing, China, p. 31-36 6 p.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison
Steffenelli, M., Todt, J., Riedl, A., Ecker, W., Müller, T., Daniel, R., Burghammer, M. & Keckes, J., 2013, In: Journal of applied crystallography. 46, p. 1-8Research output: Contribution to journal › Article › Research › peer-review
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X-ray based tools for the investigation of buried interfaces in organic electronic devices
Neuhold, A., Brandner, H., Ausserlechner, S. J., Lorbek, S., Neuschitzer, M., Zojer, E., Teichert, C. & Resel, R., 2013, In: Organic electronics. 14, p. 479-487Research output: Contribution to journal › Article › Research › peer-review
