Review of scientific instruments, ‎0034-6748

Journal

ISSNs0034-6748
1 - 8 out of 8Page size: 10

Publications / Theses

  1. 2020
  2. Published

    An SEM compatible plasma cell for in situ studies of hydrogen-material interaction

    Massone, A., Manhard, A., Jacob, W., Drexler, A., Ecker, W., Hohenwarter, A., Wurster, S. & Kiener, D., 1 Apr 2020, In: Review of scientific instruments. 91, 4, 043705.

    Research output: Contribution to journal › Article › Research › peer-review

  3. 2018
  4. Published

    A new device for high-temperature in situ GISAXS measurements

    Fritz-Popovski, G., Bodner, S. C., Sosada-Ludwikowska, F., Maier, G. A., Morak, R., Chitu, L., Bruegemann, L., Lange, J., Krane, H. G. & Paris, O., 5 Mar 2018, In: Review of scientific instruments. 89.2018, 3, 035103.

    Research output: Contribution to journal › Article › Research › peer-review

  5. 2017
  6. Published

    A versatile atomic force microscope integrated with a scanning electron microscope

    Kreith, J., Strunz, T., Fantner, E. J., Fantner, G. E. & Cordill, M., 2017, In: Review of scientific instruments. 88, 5, 053704.

    Research output: Contribution to journal › Article › Research › peer-review

  7. 2014
  8. Published

    A new method for polychromatic X-ray μLaue diffraction on a Cu pillar using an energy-dispersive pn-junction charge-coupled device

    Abboud, A., Kirchlechner, C., Send, S., Micha, J. S., Ulrich, O., Pashniak, N., Strüder, L. W. J., Keckes, J. & Pietsch, U., 2014, In: Review of scientific instruments. 85, p. 1139011-1139018

    Research output: Contribution to journal › Article › Research › peer-review

  9. 2012
  10. Published

    Joint strength measurements of individual fiber-fiber bonds: An atomic force microscopy based method

    Schmied, F., Teichert, C., Kappel, L., Hirn, U. & Schennach, R., 2012, In: Review of scientific instruments. p. 073902-1-073902-8

    Research output: Contribution to journal › Article › Research › peer-review

  11. Published

    Novel temperature dependent tensile test of freestanding copper thin film structures

    Smolka, M., Motz, C., Detzel, T., Robl, W., Grießer, T., Wimmer, A. C. & Dehm, G., 2012, In: Review of scientific instruments. Jun;(6), p. 064702/1-064702/9

    Research output: Contribution to journal › Article › Research › peer-review

  12. 2010
  13. Published

    Imaging dislocations in gallium nitride across broad areas using atomic force microscopy

    Bennett, S. E., Holec, D., Kappers, M. J., Humphreys, C. J. & Oliver, R. A., 2010, In: Review of scientific instruments. p. 0637011-0637017

    Research output: Contribution to journal › Article › Research › peer-review

  14. 2007
  15. Published

    High-temperature residual stresses in thin films characterized by x-ray diffraction substrate curvature method

    Keckes, J., Eiper, E., Martinschitz, K. J., Köstenbauer, H., Daniel, R. & Mitterer, C., 2007, In: Review of scientific instruments. 78, p. 036103-01-036103-03

    Research output: Contribution to journal › Article › Research › peer-review

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