Microscopy and microanalysis, 1431-9276
Journal
ISSNs | 1431-9276 |
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11 - 15 out of 15Page size: 10
Publications / Theses
- 2010
- Published
Mitigating Focused Ion Beam Damage in Molybdenum Nanopillars by In Situ Annealing
Lowry, M. B., Kiener, D., Le Blanc, B. B., Chisholm, C., Florando, J. N., Morris, J. W. J. & Minor, A. M., 2010, In: Microscopy and microanalysis. 16, p. 1748-1749Research output: Contribution to journal › Article › Research › peer-review
- 2009
- Published
Sensitivity and Quantitativity in Atom Probe Tomography
Danoix, F., Bostel, A., Leitner, H., Jessner, P., Sauvage, X., Gouné, M. & Danoix, R., 2009, In: Microscopy and microanalysis. p. 258-259Research output: Contribution to journal › Article › Research › peer-review
- 2007
- Published
Conventional TEM investigation of the FIB damage in copper
Kiener, D., Jörg, T., Rester, M., Motz, C. & Dehm, G., 2007, In: Microscopy and microanalysis. 13, p. 100-101Research output: Contribution to journal › Article › Research › peer-review
- Published
Size-Induced Transition from Perfect to Partial Dislocation Plasticity in Single Crystal Au Films on Polyimide
Oh, S. H., Legros, M., Kiener, D., Gruber, P. A. & Dehm, G., 2007, In: Microscopy and microanalysis. 13, p. 278-279Research output: Contribution to journal › Article › Research › peer-review
- 2003
- Published
Quantification of the Recrystallized Fraction in a Nickel-Base-Alloy from EBSD data
Mitsche, S., Pölt, P., Sommitsch, C. & Walter, M., 2003, In: Microscopy and microanalysis. Suppl. 3, p. 344-345Research output: Contribution to journal › Article › Research › peer-review