Electrically reversible cracks in an intermetallic film controlled by an electric field

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

Autoren

  • Z.Q. Liu
  • J.H. Liu
  • M.D. Biegalski
  • J.-M. Hu
  • S.L. Shang
  • Y. Ji
  • J.M. Wang
  • S.L. Hsu
  • A.T. Wong
  • B. Gludovatz
  • C. Marker
  • H. Yan
  • Z.X. Feng
  • L. You
  • M.W. Lin
  • T.Z. Ward
  • Z.K. Liu
  • C.B. Jiang
  • L.Q. Chen
  • R.O. Ritchie
  • H.M. Christen
  • R. Ramesh

Organisationseinheiten

Externe Organisationseinheiten

  • School of Materials Science and Engineering, Beijing
  • Center for Nanophase Materials Sciences, Oak Ridge National Laboratory
  • The Pennsylvania State University
  • University of California, Berkeley
  • Materials Science and Technology Division, Oak Ridge National Laboratory
  • Erich Schmid Institute of Materials Science of the Austrian Academy of Sciences
  • School of Mechanical and Manufacturing Engineering, UNSW Sydney
  • School of Optical and Electronic Information, Huazhong University of Science and Technology

Details

OriginalspracheEnglisch
Aufsatznummer9
Seitenumfang7
FachzeitschriftNature Communications
Jahrgang41.2018
Ausgabenummer9
DOIs
StatusVeröffentlicht - 3 Jan. 2018